Wafer-level MEMS packaging via thermally released metal-organic membranes

This paper reports on the design, implementation and characterization of wafer-level packaging technology for a wide range of microelectromechanical system (MEMS) devices. The encapsulation technique is based on thermal decomposition of a sacrificial polymer through a polymer overcoat to form a released thin-film organic membrane with scalable height on top of the active part of the MEMS. Hermiticity and vacuum operation are obtained by thin-film deposition of a metal such as chromium, aluminum or gold. The thickness of the overcoat can be optimized according to the size of the device and differential pressure to package a wide variety of MEMS such as resonators, accelerometers and gyroscopes. The key performance metrics of several batches of packaged devices do not degrade as a result of residues from the sacrificial polymer. A Q factor of 5000 at a resonant frequency of 2.5 MHz for the packaged resonator, and a static sensitivity of 2 pF g−1 for the packaged accelerometer were obtained. Cavities as small as 0.000 15 mm3 for the resonator and as large as 1 mm3 for the accelerometer have been made by this method. (Some figures in this article are in colour only in the electronic version)